Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique

標題:	Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique
作者:	Chang, MF Chiou, LY Wen, KA 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	21-七月-2005
摘要:	A dynamic bitline shielding (DBS) technique is proposed for highspeed via-programming ROMs, to eliminate code-pattem-dependent crosstalk-induced read failure (CIRF) and increase code-pattem coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.
URI:	http://dx.doi.org/10.1049/el:20051738 http://hdl.handle.net/11536/13476
ISSN:	0013-5194
DOI:	10.1049/el:20051738
期刊:	ELECTRONICS LETTERS
Volume:	41
Issue:	15
起始頁:	834
結束頁:	835
顯示於類別：	期刊論文

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