完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Yen, Li-Chen | en_US |
dc.contributor.author | Tang, Ming-Tsyr | en_US |
dc.contributor.author | Tan, Chia-Ying | en_US |
dc.contributor.author | Pan, Tung-Ming | en_US |
dc.contributor.author | Chao, Tien-Sheng | en_US |
dc.date.accessioned | 2015-07-21T11:20:55Z | - |
dc.date.available | 2015-07-21T11:20:55Z | - |
dc.date.issued | 2014-12-01 | en_US |
dc.identifier.issn | 0741-3106 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/LED.2014.2365478 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/123866 | - |
dc.description.abstract | We investigate the effect of sensing film thickness on the sensing characteristics of dual-gate (DG) poly-Si ion-sensitive field-effect transistors (ISFETs). The pH sensitivity (from 37.57 to 9.32 mV/pH) of the DG poly-Si ISFET device degrades with the increase in the sensing film thickness (from 20 to 120 nm), whereas hysteresis voltage (from 6.7 to 1.12 mV for a neutral to acid to alkaline to neural loop) and drift rate (from 13.47 to <3 mV/h at pH 7) improve accordingly. An improved hysteresis and drift phenomena are attributed to the reduction in top-gate capacitance of the sensing membrane, causing a smaller capacitive-coupling ratio (top-gate capacitance of sensing membrane to bottom-gate capacitance of tetraethylorthosilicate oxide). | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Drift | en_US |
dc.subject | dual-gate (DG) | en_US |
dc.subject | hysteresis | en_US |
dc.subject | ion-sensitive field-effect transistor (ISFET) | en_US |
dc.subject | poly-Si | en_US |
dc.subject | sensitivity | en_US |
dc.title | Effect of Sensing Film Thickness on Sensing Characteristics of Dual-Gate Poly-Si Ion-Sensitive Field-Effect-Transistors | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/LED.2014.2365478 | en_US |
dc.identifier.journal | IEEE ELECTRON DEVICE LETTERS | en_US |
dc.citation.volume | 35 | en_US |
dc.citation.issue | 12 | en_US |
dc.citation.spage | 1302 | en_US |
dc.citation.epage | 1304 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:000345575400047 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 期刊論文 |