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dc.contributor.authorChung, Pei-Kangen_US
dc.contributor.authorYen, Shun-Tungen_US
dc.date.accessioned2015-07-21T11:20:50Z-
dc.date.available2015-07-21T11:20:50Z-
dc.date.issued2014-10-21en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4898037en_US
dc.identifier.urihttp://hdl.handle.net/11536/123963-
dc.description.abstractWe propose a simple and reliable method for extracting the optical constants of homogeneous dielectrics which can be pure or impure, and polar or nonpolar. The extraction is made from fringing reflectance spectra of slab samples with and without metal on the backside. The method is demonstrated to work well for polar semiconductors GaAs and InP in the infrared regime. The extracted extinction coefficient spectra exhibit plenty of features which correspond well to those in absorption and Raman spectra. (C) 2014 AIP Publishing LLC.en_US
dc.language.isoen_USen_US
dc.titleExtraction of infrared optical constants from fringing reflectance spectraen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.4898037en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume116en_US
dc.citation.issue15en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000344345400001en_US
dc.citation.woscount1en_US
Appears in Collections:Articles


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