標題: A modified HICUM model for GaInP/GaAs HBT devices
作者: Tseng, SC
Meng, CC
Chen, WY
Su, JY
電信工程研究所
Institute of Communications Engineering
關鍵字: transit time;GaInP/GaAs HBT;minority charge;HICUM and VBIC
公開日期: 1-四月-2006
摘要: A compact physics-based transit-time model is established for the GaInP/GaAs HBT device. The VBIC model fails to describe the transit-time frequency versus bias (I-C, V-CE), especially at low- and medium-current regimes. Starting with the HICUM model, we introduce a new time constant to describe the transit-time frequency versus bias (I-C, V-CE) more precisely. This model has obvious advantages over the VBIC model for showing the relation oj'f, versus bias (I-C, V-CE) in the low and medium current regimes for GaInP/GaAs HBT devices. (c) 2006 Wiley Periodicals, Inc.
URI: http://dx.doi.org/10.1002/mop.21474
http://hdl.handle.net/11536/12406
ISSN: 0895-2477
DOI: 10.1002/mop.21474
期刊: MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
Volume: 48
Issue: 4
起始頁: 780
結束頁: 783
顯示於類別:期刊論文


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