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dc.contributor.authorWang, Yao-Chinen_US
dc.contributor.authorLin, Bor-Shyhen_US
dc.date.accessioned2015-07-21T08:27:48Z-
dc.date.available2015-07-21T08:27:48Z-
dc.date.issued2014-11-01en_US
dc.identifier.issn1751-8822en_US
dc.identifier.urihttp://dx.doi.org/10.1049/iet-smt.2013.0190en_US
dc.identifier.urihttp://hdl.handle.net/11536/124132-
dc.description.abstractWith advanced small-pixel and high-resolution mobile displays, the display are obtaining smaller pixel size and higher resolution on thin-film-transistor (TFT) array process. This study proposed the flaw detection and measurement in small pixel design mobile displays based on oxide-semiconductor-based TFT liquid crystal displays. The measurement is with respect to electrical-physic characterisation metrics and observer studies. Studies resulted in small-sized pixel TFT array between the flaw detection performance and maker preference approaches. Detection performance factors provided information on the differences among small pixel design for advanced mobile display technologies. The results of the detection performance and preference study showed that the application for advanced mobile display panels. It also shown that critical pixel defect played an important role than previously seen in non-small pixel TFT array panels for managing process yield. The method of voltage imaging for detection, developed in this study provides an initial insight into the high resolution of small-sized pixel designs for advanced mobile displays with precision and diagnostic images in portable devices.en_US
dc.language.isoen_USen_US
dc.subjectflaw detectionen_US
dc.subjectthin film transistorsen_US
dc.subjectflat panel displaysen_US
dc.subjectportable instrumentsen_US
dc.subjectliquid crystal displaysen_US
dc.subjectcomputer displaysen_US
dc.subjectflaw measurementen_US
dc.subjectthin film transistor array processen_US
dc.subjectpixel design mobile display panelen_US
dc.subjectoxide semiconductor-based TFT liquid crystal displayen_US
dc.subjectelectrical-physic characterisation metricsen_US
dc.subjectsmall-sized pixel TFT arrayen_US
dc.subjectflaw detection performanceen_US
dc.subjectcritical pixel defecten_US
dc.subjectvoltage imagingen_US
dc.subjectportable devicesen_US
dc.titleFlaw detection and measurement for mobile displayen_US
dc.typeArticleen_US
dc.identifier.doi10.1049/iet-smt.2013.0190en_US
dc.identifier.journalIET SCIENCE MEASUREMENT & TECHNOLOGYen_US
dc.citation.spage546en_US
dc.citation.epage551en_US
dc.contributor.department光電系統研究所zh_TW
dc.contributor.department影像與生醫光電研究所zh_TW
dc.contributor.department生醫電子轉譯研究中心zh_TW
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.contributor.departmentInstitute of Imaging and Biomedical Photonicsen_US
dc.contributor.departmentBiomedical Electronics Translational Research Centeren_US
dc.identifier.wosnumberWOS:000346338500024en_US
dc.citation.woscount0en_US
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