Flaw detection and measurement for 4K Ultra HD thin-film-transistor array panel

標題:	Flaw detection and measurement for 4K Ultra HD thin-film-transistor array panel
作者:	Wang, Yao-Chin Lin, Bor-Shyh Yang, Kei-Hsiung 光電系統研究所影像與生醫光電研究所 Institute of Photonic System Institute of Imaging and Biomedical Photonics
關鍵字:	Flaw detection;Measurement;4K Ultra HD;TFT array panel
公開日期:	1-五月-2014
摘要:	Display pixels of liquid-crystal-display televisions (LCD TVs) on thin-film-transistor (TFT) array are getting smaller. This paper introduced the method of voltage imaging technique, which developed and provides initial insight into the thin-film-transistor array flaw detection and measurement for ultra-high-definition (Ultra HD, UHD) LCD TV application. We proposed the measurement of flaw detection, based on TFT array testing and characterization with respect to opto-electric transformation measurement. (C) 2014 Elsevier Ltd. All rights reserved.
URI:	http://dx.doi.org/10.1016/j.measurement.2014.02.022 http://hdl.handle.net/11536/24206
ISSN:	0263-2241
DOI:	10.1016/j.measurement.2014.02.022
期刊:	MEASUREMENT
Volume:	51
Issue:
起始頁:	236
結束頁:	240
顯示於類別：	期刊論文

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