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dc.contributor.authorWang, Yao-Chinen_US
dc.contributor.authorLin, Bor-Shyhen_US
dc.contributor.authorYang, Kei-Hsiungen_US
dc.date.accessioned2014-12-08T15:35:49Z-
dc.date.available2014-12-08T15:35:49Z-
dc.date.issued2014-05-01en_US
dc.identifier.issn0263-2241en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.measurement.2014.02.022en_US
dc.identifier.urihttp://hdl.handle.net/11536/24206-
dc.description.abstractDisplay pixels of liquid-crystal-display televisions (LCD TVs) on thin-film-transistor (TFT) array are getting smaller. This paper introduced the method of voltage imaging technique, which developed and provides initial insight into the thin-film-transistor array flaw detection and measurement for ultra-high-definition (Ultra HD, UHD) LCD TV application. We proposed the measurement of flaw detection, based on TFT array testing and characterization with respect to opto-electric transformation measurement. (C) 2014 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectFlaw detectionen_US
dc.subjectMeasurementen_US
dc.subject4K Ultra HDen_US
dc.subjectTFT array panelen_US
dc.titleFlaw detection and measurement for 4K Ultra HD thin-film-transistor array panelen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.measurement.2014.02.022en_US
dc.identifier.journalMEASUREMENTen_US
dc.citation.volume51en_US
dc.citation.issueen_US
dc.citation.spage236en_US
dc.citation.epage240en_US
dc.contributor.department光電系統研究所zh_TW
dc.contributor.department影像與生醫光電研究所zh_TW
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.contributor.departmentInstitute of Imaging and Biomedical Photonicsen_US
dc.identifier.wosnumberWOS:000336016400024-
dc.citation.woscount0-
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