Flaw detection and measurement for 4K Ultra HD thin-film-transistor array panel

doi:10.1016/j.measurement.2014.02.022

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Wang, Yao-Chin	en_US
dc.contributor.author	Lin, Bor-Shyh	en_US
dc.contributor.author	Yang, Kei-Hsiung	en_US
dc.date.accessioned	2014-12-08T15:35:49Z	-
dc.date.available	2014-12-08T15:35:49Z	-
dc.date.issued	2014-05-01	en_US
dc.identifier.issn	0263-2241	en_US
dc.identifier.uri	http://dx.doi.org/10.1016/j.measurement.2014.02.022	en_US
dc.identifier.uri	http://hdl.handle.net/11536/24206	-
dc.description.abstract	Display pixels of liquid-crystal-display televisions (LCD TVs) on thin-film-transistor (TFT) array are getting smaller. This paper introduced the method of voltage imaging technique, which developed and provides initial insight into the thin-film-transistor array flaw detection and measurement for ultra-high-definition (Ultra HD, UHD) LCD TV application. We proposed the measurement of flaw detection, based on TFT array testing and characterization with respect to opto-electric transformation measurement. (C) 2014 Elsevier Ltd. All rights reserved.	en_US
dc.language.iso	en_US	en_US
dc.subject	Flaw detection	en_US
dc.subject	Measurement	en_US
dc.subject	4K Ultra HD	en_US
dc.subject	TFT array panel	en_US
dc.title	Flaw detection and measurement for 4K Ultra HD thin-film-transistor array panel	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1016/j.measurement.2014.02.022	en_US
dc.identifier.journal	MEASUREMENT	en_US
dc.citation.volume	51	en_US
dc.citation.issue		en_US
dc.citation.spage	236	en_US
dc.citation.epage	240	en_US
dc.contributor.department	光電系統研究所	zh_TW
dc.contributor.department	影像與生醫光電研究所	zh_TW
dc.contributor.department	Institute of Photonic System	en_US
dc.contributor.department	Institute of Imaging and Biomedical Photonics	en_US
dc.identifier.wosnumber	WOS:000336016400024	-
dc.citation.woscount	0	-
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