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dc.contributor.authorHuang, Kou-Jenen_US
dc.contributor.authorHuang, Kou-Yuanen_US
dc.contributor.authorChen, I-Chiehen_US
dc.contributor.authorWang, Luke K.en_US
dc.date.accessioned2015-07-21T11:20:39Z-
dc.date.available2015-07-21T11:20:39Z-
dc.date.issued2014-12-01en_US
dc.identifier.issn1939-1404en_US
dc.identifier.urihttp://dx.doi.org/10.1109/JSTARS.2014.2344756en_US
dc.identifier.urihttp://hdl.handle.net/11536/124261-
dc.description.abstractSequential pattern detection with simulated annealing (SA) is adopted to estimate parameters and detect lines, ellipses, hyperbolas type by type, and patterns by patterns in each type. The motivation of the sequential detection method is to deal with multiple patterns. The parameters of a pattern are formed as a vector and used as a state, and adjusted in SA. A sequential detection algorithm using SA to detect patterns is proposed. It detects one or a small number of patterns at each step. SA has the capability of the global minimization. The six parameters of patterns are adjusted sequentially step by step. The computation can converge efficiently. In the experiment, the result of sequential detection is better than that of synchronous detection in detecting a large number of patterns. In sequential detection, detection of one pattern at each step can have less computation time and good convergence in total detection than using two or more pattern detections. In simulated seismic data, SA is applied to detect the hyperbolas in the common depth point (CDP) gather. In real one-shot seismogram, SA is applied to detect lines of direct wave and hyperbolas of reflection wave. The results can show that the proposed method is feasible.en_US
dc.language.isoen_USen_US
dc.subjectEllipseen_US
dc.subjecthyperbolaen_US
dc.subjectlineen_US
dc.subjectparametric pattern detectionen_US
dc.subjectseismic patternsen_US
dc.subjectsequential detectionen_US
dc.subjectsimulated annealing (SA)en_US
dc.titleSimulated Annealing for Sequential Pattern Detection and Seismic Applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/JSTARS.2014.2344756en_US
dc.identifier.journalIEEE JOURNAL OF SELECTED TOPICS IN APPLIED EARTH OBSERVATIONS AND REMOTE SENSINGen_US
dc.citation.issue12en_US
dc.citation.spage4849en_US
dc.citation.epage4859en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000348372000021en_US
dc.citation.woscount0en_US
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