Statistics
Total Visits
| Views | |
|---|---|
| Electrical characteristic fluctuation of 16-nm-gate high-kappa/metal gate bulk FinFET devices in the presence of random interface traps | 12 |
Total Visits per Month
| 六月 2025 | 七月 2025 | 八月 2025 | 九月 2025 | 十月 2025 | 十一月 2025 | 十二月 2025 | |
|---|---|---|---|---|---|---|---|
| Electrical characteristic fluctuation of 16-nm-gate high-kappa/metal gate bulk FinFET devices in the presence of random interface traps | 0 | 0 | 0 | 0 | 0 | 1 | 1 |
File Downloads
| Views | |
|---|---|
| 000347644800003.pdf | 12 |
Top Country Views
| Views | |
|---|---|
| 美國 | 6 |
| 中國 | 3 |
| EU | 1 |
| 俄羅斯聯邦 | 1 |
Top City Views
| Views | |
|---|---|
| Beijing | 3 |
| Menlo Park | 3 |
| Saint Robert | 2 |
| San Jose | 1 |