標題: Approximately Unbiased Estimator for Non-Normal Process Capability Index C-Npk
作者: Pearn, W. L.
Tai, Y. T.
Hsiao, I. F.
Ao, Y. P.
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: non-normal process;lower confidence bound;bootstrap
公開日期: 1-Nov-2014
摘要: Process capability indices (PCIs) have been extensively used to evaluate and measure whether the process meets the specifications and they provide quality assurance and guide a principal for quality improvement. The index C-pk is the most popular index and is widely used in the manufacturing industry for manufacturing yield evaluation. However, typical evaluations of C-pk depend heavily on the assumption of normal variability. When the underlying distributions are non-normal, the capability evaluations are highly unreliable. In the paper, we apply four various bootstrap methods to construct lower confidence bounds of C-Npk for non-normal processes. We also propose an approximately unbiased estimator of C-Npk for the non-normal processes. Comparisons among the four bootstrap methods with different estimators are provided.
URI: http://dx.doi.org/10.1520/JTE20130125
http://hdl.handle.net/11536/124282
ISSN: 0090-3973
DOI: 10.1520/JTE20130125
期刊: JOURNAL OF TESTING AND EVALUATION
Volume: 42
Appears in Collections:Articles