Title: The port-to-port isolation of the downconversion P-type micromixer using different N-well topologies
Authors: Tseng, SC
Meng, CC
Li, YH
Huang, GW
電信工程研究所
Institute of Communications Engineering
Keywords: micromixer;port-to-port isolation;body effect;well isolation
Issue Date: 1-Apr-2006
Abstract: The port-to-port isolation of the micromixer is studied using three different p-type downconversion micromixers in 0.35-mu m CMOS technology. Both the body effect and the well isolation influence the port-to-port isolation significantly. The body effect degrades the LO-to-RF isolation and also deteriorates the LO-to-RF isolation. Without the well isolation, the LO-to-RF isolation drops. However, the RF-to-IF isolation is independent of the body effect and well isolation. The p-type micromixer with a separate N-well and without body effect has the best port-to-port isolation properties; its LO-to-IF, LO-to-RF, and RF-to-IF isolations are -59 dB, -58 dB, and -30 dB, respectively.
URI: http://dx.doi.org/10.1093/ietele/e89-c.4.482
http://hdl.handle.net/11536/12446
ISSN: 0916-8524
DOI: 10.1093/ietele/e89-c.4.482
Journal: IEICE TRANSACTIONS ON ELECTRONICS
Volume: E89C
Issue: 4
Begin Page: 482
End Page: 487
Appears in Collections:Articles