標題: | The port-to-port isolation of the downconversion P-type micromixer using different N-well topologies |
作者: | Tseng, SC Meng, CC Li, YH Huang, GW 電信工程研究所 Institute of Communications Engineering |
關鍵字: | micromixer;port-to-port isolation;body effect;well isolation |
公開日期: | 1-Apr-2006 |
摘要: | The port-to-port isolation of the micromixer is studied using three different p-type downconversion micromixers in 0.35-mu m CMOS technology. Both the body effect and the well isolation influence the port-to-port isolation significantly. The body effect degrades the LO-to-RF isolation and also deteriorates the LO-to-RF isolation. Without the well isolation, the LO-to-RF isolation drops. However, the RF-to-IF isolation is independent of the body effect and well isolation. The p-type micromixer with a separate N-well and without body effect has the best port-to-port isolation properties; its LO-to-IF, LO-to-RF, and RF-to-IF isolations are -59 dB, -58 dB, and -30 dB, respectively. |
URI: | http://dx.doi.org/10.1093/ietele/e89-c.4.482 http://hdl.handle.net/11536/12446 |
ISSN: | 0916-8524 |
DOI: | 10.1093/ietele/e89-c.4.482 |
期刊: | IEICE TRANSACTIONS ON ELECTRONICS |
Volume: | E89C |
Issue: | 4 |
起始頁: | 482 |
結束頁: | 487 |
Appears in Collections: | Articles |