標題: | Manipulation of nanoscale V-pits to optimize internal quantum efficiency of InGaN multiple quantum wells |
作者: | Chang, Chiao-Yun Li, Heng Shih, Yang-Ta Lu, Tien-Chang 光電工程學系 Department of Photonics |
公開日期: | 2-三月-2015 |
摘要: | We systematically investigated the influence of nanoscale V-pits on the internal quantum efficiency (IQE) of InGaN multiple quantum wells (MQWs) by adjusting the underlying superlattices (SLS). The analysis indicated that high barrier energy of sidewall MQWs on V-pits and long diffusion distance between the threading dislocation (TD) center and V-pit boundary were crucial to effectively passivate the non-radiative centers of TDs. For a larger V-pit, the thicker sidewall MQW on V-pit would decrease the barrier energy. On the contrary, a shorter distance between the TD center and V-pit boundary would be observed in a smaller V-pit, which could increase the carrier capturing capability of TDs. An optimized V-pit size of approximately 200-250 nm in our experiment could be concluded for MQWs with 15 pairs SLS, which exhibited an IQE value of 70%. (C) 2015 AIP Publishing LLC. |
URI: | http://dx.doi.org/10.1063/1.4914116 http://hdl.handle.net/11536/124524 |
ISSN: | 0003-6951 |
DOI: | 10.1063/1.4914116 |
期刊: | APPLIED PHYSICS LETTERS |
Volume: | 106 |
顯示於類別: | 期刊論文 |