標題: Estimating process capability index C-pk: classical approach versus Bayesian approach
作者: Pearn, Wen Lea
Wu, Chin Chieh
Wu, Chia Huang
統計學研究所
工業工程與管理學系
Institute of Statistics
Department of Industrial Engineering and Management
關鍵字: process capability index;Classical method;Bayesian method;credible interval;lower confidence bound
公開日期: 3-七月-2015
摘要: Process capability index C-pk has been the most popular one used in the manufacturing industry dealing with problems of measuring reproduction capability of processes to enhance product development with very low fraction of defectives. In the manufacturing industry, lower confidence bound (LCB) estimates the minimum process capability providing pivotal information for quality engineers to monitoring the process and assessing process performance for quality assurance. The main objective of this paper is to compare and contrast the LCBs on C-pk using two approaches, Classical method and Bayesian method.
URI: http://dx.doi.org/10.1080/00949655.2014.914211
http://hdl.handle.net/11536/124624
ISSN: 0094-9655
DOI: 10.1080/00949655.2014.914211
期刊: JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION
Volume: 85
Issue: 10
起始頁: 2007
結束頁: 2021
顯示於類別:期刊論文