标题: | Estimating process capability index C-pk: classical approach versus Bayesian approach |
作者: | Pearn, Wen Lea Wu, Chin Chieh Wu, Chia Huang 统计学研究所 工业工程与管理学系 Institute of Statistics Department of Industrial Engineering and Management |
关键字: | process capability index;Classical method;Bayesian method;credible interval;lower confidence bound |
公开日期: | 3-七月-2015 |
摘要: | Process capability index C-pk has been the most popular one used in the manufacturing industry dealing with problems of measuring reproduction capability of processes to enhance product development with very low fraction of defectives. In the manufacturing industry, lower confidence bound (LCB) estimates the minimum process capability providing pivotal information for quality engineers to monitoring the process and assessing process performance for quality assurance. The main objective of this paper is to compare and contrast the LCBs on C-pk using two approaches, Classical method and Bayesian method. |
URI: | http://dx.doi.org/10.1080/00949655.2014.914211 http://hdl.handle.net/11536/124624 |
ISSN: | 0094-9655 |
DOI: | 10.1080/00949655.2014.914211 |
期刊: | JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION |
Volume: | 85 |
Issue: | 10 |
起始页: | 2007 |
结束页: | 2021 |
显示于类别: | Articles |