标题: | Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels |
作者: | Wang, Yao-Chin Lin, Bor-Shyh Chan, Ming-Che 光电系统研究所 影像与生医光电研究所 Institute of Photonic System Institute of Imaging and Biomedical Photonics |
关键字: | Electro-optical measurement;Integrated gate driver;TFT array panel |
公开日期: | 1-六月-2015 |
摘要: | The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance. (C) 2015 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.measurement.2015.03.018 http://hdl.handle.net/11536/124629 |
ISSN: | 0263-2241 |
DOI: | 10.1016/j.measurement.2015.03.018 |
期刊: | MEASUREMENT |
Volume: | 70 |
起始页: | 83 |
结束页: | 87 |
显示于类别: | Articles |