标题: Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels
作者: Wang, Yao-Chin
Lin, Bor-Shyh
Chan, Ming-Che
光电系统研究所
影像与生医光电研究所
Institute of Photonic System
Institute of Imaging and Biomedical Photonics
关键字: Electro-optical measurement;Integrated gate driver;TFT array panel
公开日期: 1-六月-2015
摘要: The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance. (C) 2015 Elsevier Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/j.measurement.2015.03.018
http://hdl.handle.net/11536/124629
ISSN: 0263-2241
DOI: 10.1016/j.measurement.2015.03.018
期刊: MEASUREMENT
Volume: 70
起始页: 83
结束页: 87
显示于类别:Articles