標題: Investigation of Backgate-Bias Dependence of Intrinsic Variability for UTB Hetero-Channel MOSFETs Considering Quantum Confinement
作者: Yu, Chang-Hung
Su, Pin
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-Jan-2013
摘要: 
URI: http://hdl.handle.net/11536/124974
ISBN: 978-1-4799-0811-0; 978-1-4799-0812-7
ISSN: 1548-3770
期刊: 2013 71ST ANNUAL DEVICE RESEARCH CONFERENCE (DRC)
起始頁: 59
結束頁: 60
Appears in Collections:Conferences Paper