完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hsueh, Sung S. -Y. | en_US |
dc.contributor.author | Huang, Ryan H. -M. | en_US |
dc.contributor.author | Wen, Charles H. -P. | en_US |
dc.date.accessioned | 2015-07-21T08:31:24Z | - |
dc.date.available | 2015-07-21T08:31:24Z | - |
dc.date.issued | 2014-01-01 | en_US |
dc.identifier.isbn | 978-1-4799-3946-6 | en_US |
dc.identifier.issn | 1948-3287 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/125013 | - |
dc.description.abstract | Soft error has become one of the most critical reliability issues for nano-scaled CMOS designs. Many previous works discovered that the pulse width due to a particle strike on the device increases with temperature, but its system-level effect has not yet been investigated with statistical soft-error-rate (SER). Therefore, in this paper, a combinational circuit (c17 from ISCAS\'85) using a 45nm CMOS technology is f rst observed under different temperatures for SER. As a result, a SER increase (2.16X more) is found on c17 as the ambient temperature elevates from 25 degrees C to 125 degrees C. Second, along with growing design complexity, the operational temperatures of gates are distributed in a wide range and much higher than the ambient temperature in reality. Therefore, we are motivated to build a temperature-aware SSER analysis framework that integrates statistical cell modeling to consider the ambient temperature (T-a) and the temperature variation (T-v), simultaneously. Experimental result shows that our SSER analysis framework is highly effcient (with multiple-order speed-ups) and accurate (with only <4% errors), when compared with Monte-Carlo SPICE simulation. | en_US |
dc.language.iso | en_US | en_US |
dc.title | TASSER: A Temperature-Aware Statistical Soft-Error-Rate Analysis Framework for Combinational Circuits | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | PROCEEDINGS OF THE 2014 FIFTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED 2014) | en_US |
dc.citation.spage | 529 | en_US |
dc.citation.epage | 534 | en_US |
dc.contributor.department | 電機資訊學士班 | zh_TW |
dc.contributor.department | Undergraduate Honors Program of Electrical Engineering and Computer Science | en_US |
dc.identifier.wosnumber | WOS:000349547600074 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 會議論文 |