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dc.contributor.authorDu, Juanen_US
dc.contributor.authorLi, Zehanen_US
dc.contributor.authorKobayashi, Takayoshien_US
dc.contributor.authorZhao, Yuananen_US
dc.contributor.authorLeng, Yuxinen_US
dc.date.accessioned2015-07-21T11:21:54Z-
dc.date.available2015-07-21T11:21:54Z-
dc.date.issued2014-01-01en_US
dc.identifier.isbn978-1-62841-301-4en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://dx.doi.org/10.1117/12.2073613en_US
dc.identifier.urihttp://hdl.handle.net/11536/125165-
dc.description.abstractThe laser induced ultrafast dynamics in fused silica under few-cycle UV laser excitation is investigated in the present study. Using sub-10 fs UV laser pulses, we characterize the free carrier dynamics in the fused silica before laser damage. After laser excitation, free carrier in the conductive band is found to turn into self-trapped excitons within about 300fs. It is possible that the trapped exciton will result in the incubation effect under the condition of ultrafast high-frequency pulsed UV laser exposure.en_US
dc.language.isoen_USen_US
dc.subjectultrafast laser spectroscopyen_US
dc.subjectUV laseren_US
dc.subjectself-trapped excitonsen_US
dc.subjectinduced absorbance changeen_US
dc.titleUltrafast UV laser induced dynamics in dielectric coating materials before laser damageen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.2073613en_US
dc.identifier.journalPACIFIC RIM LASER DAMAGE 2014: OPTICAL MATERIALS FOR HIGH POWER LASERSen_US
dc.citation.volume9238en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000354517800005en_US
dc.citation.woscount0en_US
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