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dc.contributor.authorLin, HCen_US
dc.contributor.authorLee, MCen_US
dc.date.accessioned2014-12-08T15:02:36Z-
dc.date.available2014-12-08T15:02:36Z-
dc.date.issued1996-06-01en_US
dc.identifier.issn0577-9073en_US
dc.identifier.urihttp://hdl.handle.net/11536/1254-
dc.description.abstractWe report the first Raman experiments of the quaternary InAs0.7P0.2Sb0.1 film. This film was grown by liquid phase epitaxy on InAs substrate to minimize the strain on the interface due to lattice mismatch. As probed by various emission lines of both Ar+ and Kr+ ion lasers, we observed three immiscible bands that correspond to the InAs, InP and InSb substructures. The scattering intensity of each band is proportional to the composition ratios of 7:2:1 as expected that indicates rather homogeneous alloying. Due to mixing of the group-V elements, the LO phonon softening of three bands is present with the red shifts of 5, 34, and 8 cm(-1), respectively. Low temperature measurements resolved more clear structures at low energy side of these bands. We also observed the resonance effect that occurs in the vicinity of E(1) transition of InAs at 2.6 eV.en_US
dc.language.isoen_USen_US
dc.titleRaman scattering in quaternary InAs0.7P0.2Sb0.1 filmen_US
dc.typeArticleen_US
dc.identifier.journalCHINESE JOURNAL OF PHYSICSen_US
dc.citation.volume34en_US
dc.citation.issue3en_US
dc.citation.spage804en_US
dc.citation.epage809en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:A1996UT14400008-
dc.citation.woscount3-
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