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dc.contributor.authorLim, CGen_US
dc.contributor.authorIezekiel, Sen_US
dc.contributor.authorSnowden, CMen_US
dc.date.accessioned2014-12-08T15:17:22Z-
dc.date.available2014-12-08T15:17:22Z-
dc.date.issued2006-02-15en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2173308en_US
dc.identifier.urihttp://hdl.handle.net/11536/12620-
dc.description.abstractA carrier heating model is derived by taking into account the various temperature processes in the active layer of laser diodes. This model is then used to simulate the static and dynamic characteristics of a directly modulated 1.55 mu m distributed-feedback laser diode. The calculated results are compared with the measured results of this device as obtained in an earlier work [H. F. Liu and W. F. Ngal, IEEE J. Quantum Electron. 29, 1668 (1993)], and this reveals the significant impact of band gap shrinkage on simulated results. This study also shows that the carrier heating model is a self-consistent model that naturally describes the gain suppression phenomena in directly modulated laser diodes. (c) 2006 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleImpact of band gap shrinkage on simulated bifurcation routes in directly modulated semiconductor lasersen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2173308en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume99en_US
dc.citation.issue4en_US
dc.citation.epageen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000235663100001-
dc.citation.woscount0-
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