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dc.contributor.author許育瑋en_US
dc.contributor.authorXu, Yui-weien_US
dc.contributor.author黃育綸en_US
dc.contributor.authorHuang, Yu-Lunen_US
dc.date.accessioned2015-11-26T00:56:41Z-
dc.date.available2015-11-26T00:56:41Z-
dc.date.issued2015en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT070260042en_US
dc.identifier.urihttp://hdl.handle.net/11536/126627-
dc.language.isoen_USen_US
dc.subject測試案例zh_TW
dc.subject測試平台zh_TW
dc.subjectLTEen_US
dc.subjectSecurityen_US
dc.subjectTestCaseen_US
dc.subjectTestBeden_US
dc.titleLTE 安全測試平台與案例設計zh_TW
dc.titleThe Design of Testbed and Test Cases for LTE Securityen_US
dc.typeThesisen_US
dc.contributor.department電控工程研究所zh_TW
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