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dc.contributor.author蔡德修en_US
dc.contributor.authorTsai, Te-Hsiuen_US
dc.contributor.author李安謙en_US
dc.contributor.authorLee, An-Chenen_US
dc.date.accessioned2015-11-26T00:56:49Z-
dc.date.available2015-11-26T00:56:49Z-
dc.date.issued2015en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT070251086en_US
dc.identifier.urihttp://hdl.handle.net/11536/126703-
dc.language.isozh_TWen_US
dc.subject批次控制zh_TW
dc.subject隨機干擾zh_TW
dc.subject最小變異控制zh_TW
dc.subject干擾觀測器zh_TW
dc.subjectRun-to-Run controlen_US
dc.subjectStochastic Disturbanceen_US
dc.subjectMinimum Variance controlen_US
dc.subjectDisturbance Observeren_US
dc.title預測干擾觀測器應用於半導體製程的隨機干擾zh_TW
dc.titlePredictive Disturbance Observer Structure Applied to Stochastic Disturbances of Semiconductor Processen_US
dc.typeThesisen_US
dc.contributor.department機械工程系所zh_TW
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