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dc.contributor.authorKwei, CMen_US
dc.contributor.authorTu, YHen_US
dc.contributor.authorHsu, YHen_US
dc.contributor.authorTung, CJen_US
dc.date.accessioned2014-12-08T15:17:29Z-
dc.date.available2014-12-08T15:17:29Z-
dc.date.issued2006-02-01en_US
dc.identifier.issn0168-583Xen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.nimb.2005.08.186en_US
dc.identifier.urihttp://hdl.handle.net/11536/12671-
dc.description.abstractTheoretical derivations were made for the induced potential and the stopping power of a charged particle moving close and parallel to the surface of a solid. It was illustrated that the induced potential produced by the interaction of particle and solid depended not only on the velocity but also on the previous velocity of the particle before its last inelastic interaction. Another words, the particle kept a memory on its previous velocity, v(0), in determining the stopping power for the particle of velocity v. Based on the dielectric response theory, formulas were derived for the induced potential and the stopping power with memory effect. An extended Drude dielectric function with spatial dispersion was used in the application of these formulas for a proton moving parallel to Si surface. It was found that the induced potential with memory effect lay between induced potentials without memory effect for constant velocities v(0) and v. The memory effect was manifest as the proton changes its velocity in the previous inelastic interaction. This memory effect also reduced the stopping power of the proton. The formulas derived in the present work can be applied to any solid surface and charged particle moving with arbitrary parallel trajectory either inside or outside the solid. (c) 2005 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectmemory effecten_US
dc.subjectsurface excitationen_US
dc.subjectinelastic interactionen_US
dc.titleMemory effect on energy losses of charged particles moving parallel to solid surfaceen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.nimb.2005.08.186en_US
dc.identifier.journalNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMSen_US
dc.citation.volume243en_US
dc.citation.issue2en_US
dc.citation.spage293en_US
dc.citation.epage298en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000235093500005-
dc.citation.woscount0-
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