攔檢高解析度和高開口率面板TN製程之點缺陷

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	楊敏智	en_US
dc.contributor.author	Yang,Min-Chih	en_US
dc.contributor.author	楊界雄	en_US
dc.contributor.author	Yang,Kei-Hsiung	en_US
dc.date.accessioned	2015-11-26T00:57:21Z	-
dc.date.available	2015-11-26T00:57:21Z	-
dc.date.issued	2015	en_US
dc.identifier.uri	http://140.113.39.130/cdrfb3/record/nctu/#GT070258303	en_US
dc.identifier.uri	http://hdl.handle.net/11536/127103	-
dc.language.iso	zh_TW	en_US
dc.subject	高解析度	zh_TW
dc.subject	高開口率	zh_TW
dc.subject	面板測試	zh_TW
dc.subject	點缺陷	zh_TW
dc.subject	類列反轉驅動	zh_TW
dc.subject	High.resolution	en_US
dc.subject	High.aperture.ratio	en_US
dc.subject	Cell lighting	en_US
dc.subject	Shorting bar	en_US
dc.subject	point defect	en_US
dc.subject	quasi-column	en_US
dc.title	攔檢高解析度和高開口率面板TN製程之點缺陷	zh_TW
dc.title	Point.Detect Inspections of High.Resolution and High.Aperture.Ratio TFT TN LCD Panels	en_US
dc.type	Thesis	en_US
dc.contributor.department	光電科技學程	zh_TW
顯示於類別：	畢業論文