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dc.contributor.author彭冠中en_US
dc.contributor.authorPeng, GUAN-JHONGen_US
dc.contributor.author劉耀先en_US
dc.contributor.authorLiu, Yao-Hsienen_US
dc.date.accessioned2015-11-26T01:02:18Z-
dc.date.available2015-11-26T01:02:18Z-
dc.date.issued2015en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT070251112en_US
dc.identifier.urihttp://hdl.handle.net/11536/127320-
dc.description.abstract化學氣相沉積技術為半導體薄膜成長的主要技術。薄膜成長的好壞取決於沉積反應的均勻度,因此,基板上的流場分布便相當重要。本文以實驗的方式,建立實體CVD腔體,配合流場可視化技術,改變進氣高度、進氣與基板溫度差、基板轉速,觀察在不同實驗條件下,流場的分布情形。實驗操作主要參數:多孔式噴灑頭直徑190mm,基板直徑152.4,方形反應腔尺寸為280mm,進氣流量為15slm,進氣高度為20mm、40mm,進氣與基板溫度差為0°C-500°C,基板轉速從0rpm-500rpm,腔體壓力為常壓。研究結果發現,增加基板轉速可有效抑制熱浮力效應,但基板轉速過高,在靠近壁面處與基板上產生旋轉渦流。降低進氣高度明顯降低熱浮力效應與旋轉效應,當進氣高度從40mm降為20mm時,基板上方不會出現熱浮力渦流與旋轉渦流。隨著基板溫度上升,氣體黏滯力也會上升,旋轉雷諾數下降,將降低旋轉效應對流場的作用力。zh_TW
dc.description.abstractChemical vapor deposition (CVD) is widely used for manufacturing semiconductor materials and thin-films. The flow field influences the uniformity in the deposition process. The study build a test chamber for gas flow visualization experiments. The investigated parameters, include the showerhead-to-disk temperature difference (0-500°C), disk rotational speeds (0-500rpm), and showerhead-to-disk height (20-40mm). The result shows that buoyancy-induced recirculation can be suppressed by disk rotation. When disk rotational speeds increase, vortexes form near the chamber wall and on the disk simultaneously. When showerhead-to-disk height reduces, buoyancy-induced flow and rotation-induced flow are suppressed. When showerhead-to-disk temperature increases, viscous force also increases. Therefore, the effect of rotation decrease.en_US
dc.language.isozh_TWen_US
dc.subject化學氣相沉積zh_TW
dc.subject流場可視化zh_TW
dc.subject粒子影像測速儀zh_TW
dc.subject熱浮力效應zh_TW
dc.subject旋轉效應zh_TW
dc.subjectChemical vapor depositionen_US
dc.subjectFlow visualizationen_US
dc.subjectParticle Image Velocimetryen_US
dc.subjectbuoyancy-induced flowen_US
dc.subjectrotation-induced flowen_US
dc.title化學氣相反應室內高溫基板對於流場影響之研究zh_TW
dc.titleInvestigation of flow patterns with high temperature substrate in a chemical vapor deposition reactoren_US
dc.typeThesisen_US
dc.contributor.department機械工程系所zh_TW
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