標題: | Synchrotron Radiation Soft X-ray Induced Reduction in Graphene Oxide Characterized by Time-Resolved Photoelectron Spectroscopy |
作者: | Lin, Chi-Yuan Cheng, Cheng-En Wang, Shuai Shiu, Hung Wei Chang, Lo Yueh Chen, Chia-Hao Lin, Tsung-Wu Chang, Chen-Shiung Chien, Forest Shih-Sen 光電工程學系 Department of Photonics |
公開日期: | 11-Jun-2015 |
摘要: | Synchrotron radiation soft X-ray was employed to reduce graphene oxide (GO) films in ultrahigh vacuum. The dissociation of oxygen-containing functional groups, and the formation of sp(2) C-C bonds were revealed by time-resolved in situ X-ray photoelectron spectroscopy, demonstrating the X-ray reduction of GO. The number of C-O bonds of G-O exhibited an exponential decay with exposure time. The X-ray reduction rate of G-O was positively correlated with the intensity of low-energy secondary electrons excited from substrates by soft X-ray, indicating the C-O bonds were dissociated by secondary electrons. |
URI: | http://dx.doi.org/10.1021/jp512055g http://hdl.handle.net/11536/127892 |
ISSN: | 1932-7447 |
DOI: | 10.1021/jp512055g |
期刊: | JOURNAL OF PHYSICAL CHEMISTRY C |
Volume: | 119 |
Issue: | 23 |
起始頁: | 12910 |
結束頁: | 12915 |
Appears in Collections: | Articles |