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dc.contributor.authorZhang, Weien_US
dc.contributor.authorHu, Yingen_US
dc.contributor.authorChang, Ting-Changen_US
dc.contributor.authorChang, Kuan-Changen_US
dc.contributor.authorTsai, Tsung-Mingen_US
dc.contributor.authorChen, Hsin-Luen_US
dc.contributor.authorSu, Yu-Tingen_US
dc.contributor.authorChu, Tian-Jianen_US
dc.contributor.authorChen, Min-Chenen_US
dc.contributor.authorHuang, Hui-Chunen_US
dc.contributor.authorSu, Wan-Chingen_US
dc.contributor.authorZheng, Jin-Chengen_US
dc.contributor.authorHung, Ya-Chien_US
dc.contributor.authorSze, Simon M.en_US
dc.date.accessioned2015-12-02T02:59:17Z-
dc.date.available2015-12-02T02:59:17Z-
dc.date.issued2015-08-01en_US
dc.identifier.issn0741-3106en_US
dc.identifier.urihttp://dx.doi.org/10.1109/LED.2015.2448756en_US
dc.identifier.urihttp://hdl.handle.net/11536/128001-
dc.description.abstractThe multilevel capability of solid electrolyte resistive random access memory (RRAM) with a Pt/GeSO/TiN structure was explored for potential use as a synapse device. By varying the cutoff voltage during the dc I-V cycles or the ac pulse programming voltage amplitudes, continuous multilevel conductance states were obtained. The reference Pt/GeO/TiN RRAM was fabricated to certify the multilevel capability and was due to the character of the GeS solid electrolyte. Finally, the property of gradual conductance states was exploited to demonstrate spike-timing-dependent plasticity learning, which suggests device\'s potential for use as an electronic synapse device for neuromorphic systems.en_US
dc.language.isoen_USen_US
dc.subjectRRAMen_US
dc.subjectsolid electrolyteen_US
dc.subjectelectronic synapse deviceen_US
dc.subjectspike-timing-dependent plasticity learning (STDP)en_US
dc.titleAn Electronic Synapse Device Based on Solid Electrolyte Resistive Random Access Memoryen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/LED.2015.2448756en_US
dc.identifier.journalIEEE ELECTRON DEVICE LETTERSen_US
dc.citation.volume36en_US
dc.citation.spage772en_US
dc.citation.epage774en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000358570300012en_US
dc.citation.woscount0en_US
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