統計資料
總造訪次數
| 檢視 | |
|---|---|
| Impact of Post-Oxide Deposition Annealing on Resistive Switching in HfO2-Based Oxide RRAM and Conductive-Bridge RAM Devices | 11 |
本月總瀏覽
檔案下載
| 檢視 |
|---|
國家瀏覽排行
| 檢視 | |
|---|---|
| 美國 | 10 |
| 俄羅斯聯邦 | 1 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Menlo Park | 8 |
| Chandler | 1 |
| Kensington | 1 |
| 檢視 | |
|---|---|
| Impact of Post-Oxide Deposition Annealing on Resistive Switching in HfO2-Based Oxide RRAM and Conductive-Bridge RAM Devices | 11 |
| 檢視 |
|---|
| 檢視 | |
|---|---|
| 美國 | 10 |
| 俄羅斯聯邦 | 1 |
| 檢視 | |
|---|---|
| Menlo Park | 8 |
| Chandler | 1 |
| Kensington | 1 |