標題: Estimating Process Capability Index C-p with Various Sample Types: A Practical Implementation
作者: Wu, C. H.
Pearn, W. L.
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: critical value;hypothesis testing;lower confidence bound;process capability index;sample types
公開日期: 1-Jul-2015
摘要: Process precision index Cp has been used widely in the manufacturing industry for measuring process potential and precision. In practice, sample data with various types such as one single random sample, multiple random samples, control chart samples, and samples with gauge measurement errors may be employed to estimate the Cp index for evaluating the process potential capability. If the process is perfectly centered in the specification range, the percentage of process non-conforming (%NC) can be expressed by Cp index. In this paper, a review for estimating and testing of Cp index is presented. Some efficient MATLAB programs and illustrative examples are also provided for each type of sample data.
URI: http://dx.doi.org/10.1520/JTE20140020
http://hdl.handle.net/11536/128445
ISSN: 0090-3973
DOI: 10.1520/JTE20140020
期刊: JOURNAL OF TESTING AND EVALUATION
Volume: 43
起始頁: 906
結束頁: 916
Appears in Collections:Articles