The Analysis of Nano-Patterned Sapphire Substrates-Induced Compressive Strain to Enhance Quantum-Confined Stark Effect of InGaN-Based Light-Emitting Diodes

標題:	The Analysis of Nano-Patterned Sapphire Substrates-Induced Compressive Strain to Enhance Quantum-Confined Stark Effect of InGaN-Based Light-Emitting Diodes
作者:	Chen, Po-Hsun Su, Vincent You, Yao-Hong Lee, Ming-Lun Hsieh, Cheng-Ju Kuan, Chieh-Hsiung Chen, Hung-Ming Yang, Han-Bo Lin, Hung-Chou Lin, Ray-Ming Chu, Fu-Chuan Su, Gu-Yi 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	1-一月-2013
摘要:	This paper demonstrates that the quantum-confined stark effect of InGaN-based light-emitting diodes can be enhanced by the means of using the hexagonal nano-post patterned sapphire substrates based on the increase of the post-duty cycle.
URI:	http://hdl.handle.net/11536/128491
ISBN:	978-1-55752-973-2
ISSN:	2160-9020
期刊:	2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)
顯示於類別：	會議論文