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| The Observation of BTI-induced RTN Traps in Inversion and Accumulation Modes on HfO2 High-k Metal Gate 28nm CMOS Devices | 9 |
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| The Observation of BTI-induced RTN Traps in Inversion and Accumulation Modes on HfO2 High-k Metal Gate 28nm CMOS Devices | 9 |
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|---|
| 檢視 | |
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| 美國 | 7 |
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|---|---|
| Menlo Park | 6 |
| Kensington | 1 |
| Taipei | 1 |