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dc.contributor.authorChang, Chia-Weien_US
dc.contributor.authorChen, Jyh-Chengen_US
dc.contributor.authorChen, Chienen_US
dc.contributor.authorJan, Rong-Hongen_US
dc.date.accessioned2015-12-02T03:00:55Z-
dc.date.available2015-12-02T03:00:55Z-
dc.date.issued2013-01-01en_US
dc.identifier.isbn978-1-4799-1353-4en_US
dc.identifier.issn1930-529Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/128554-
dc.description.abstractSupporting a large number of devices in LTE Machine-to-Machine (M2M) communications is a big challenge. The large number of devices will try to access radio resource in a short period of time which may result in severe congestion to the Radio Access Network (RAN). Hence, how to scatter the devices, which are always trying to access to a same eNBs (evolved Node B), to other eNBs has become an important issue. In other words, balancing the random access intensity among eNBs will reduce the congestion of an RAN and improve the network utilization. Nevertheless, how to select an eNB to attach to during the initial access in a way that will balance overall access intensity in the network is a key challenge. Unfortunately, from the perspective of eNB, an eNB is unaware of how many devices will access to the eNB. Thus, an eNB cannot release the information about the access intensity in advance. In this paper, therefore, we propose four effective eNB selection algorithms to estimate the access intensity of an eNB. Simulation results show that the proposed algorithms perform better than conventional approach.en_US
dc.language.isoen_USen_US
dc.subjectRandom Access Procedureen_US
dc.subjectM2Men_US
dc.subjectMTCen_US
dc.subjectLTEen_US
dc.titleScattering Random-Access Intensity in LTE Machine-to-Machine (M2M) Communicationsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2013 IEEE GLOBAL COMMUNICATIONS CONFERENCE (GLOBECOM)en_US
dc.citation.spage4729en_US
dc.citation.epage4734en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000357299604138en_US
dc.citation.woscount1en_US
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