標題: Prediction of the BCI results For CAN Bus ECU using Incident Wave Excitation Method
作者: Lee, Wei Ting
Chung, Yung Chi
Chen, Chu Yu
Tang, Jing Jou
Yang, Chung Shun
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-一月-2014
摘要: In this paper, a method called the incident wave excitation method is proposed to incorporate the effects of the coupling noise onto leads of the CAN bus. The equivalent circuit model for two wires (CAN high line and CAN low line) system is firstly derived. The distributed voltage and current sources along the lead excited by the coupling noise can be computed. The set up for the ISO bulk-current injection (BCI) measurement at the IC level is performed. The computed results will be further verified and compared with BCI specific experimental results.
URI: http://hdl.handle.net/11536/128619
ISBN: 978-1-4799-4851-2
ISSN: 
期刊: 2014 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS - TAIWAN (ICCE-TW)
顯示於類別:會議論文