完整後設資料紀錄
DC 欄位語言
dc.contributor.authorHu, Roberten_US
dc.contributor.authorSang, Tzu-Hsienen_US
dc.date.accessioned2014-12-08T15:17:50Z-
dc.date.available2014-12-08T15:17:50Z-
dc.date.issued2006-01-01en_US
dc.identifier.issn0195-9271en_US
dc.identifier.urihttp://dx.doi.org/10.1007/s10762-006-9081-zen_US
dc.identifier.urihttp://hdl.handle.net/11536/12927-
dc.description.abstractIn performing microwave and millimeter-wave noise-parameter measurements, a set of generator reflection coefficients and their corresponding noise temperatures need to be measured first. Allowing measurement errors, values of these generator reflection coefficients will affect the accuracy of final results. Though simulation alone can be used to find out on the Smith chart the preferred pattern of the generator reflection coefficients, its analytical counterpart has not been explored yet. This paper intends to derive the related mathematical expressions, thus complements and strengthens the simulation method.en_US
dc.language.isoen_USen_US
dc.subjectgenerator reflection coefficienten_US
dc.subjectnoise parametersen_US
dc.subjectnoise temperatureen_US
dc.subjectleast-squares fiten_US
dc.titleAn analytical approach on the determination of generator reflection coefficients used in the noise-parameter measurementen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/s10762-006-9081-zen_US
dc.identifier.journalINTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVESen_US
dc.citation.volume27en_US
dc.citation.issue1en_US
dc.citation.spage153en_US
dc.citation.epage164en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000239628600012-
dc.citation.woscount0-
顯示於類別:期刊論文


文件中的檔案:

  1. 000239628600012.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。