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dc.contributor.authorChen, Yu-Chunen_US
dc.contributor.authorLin, Bor-Shyhen_US
dc.contributor.authorPan, Jeng-Shyangen_US
dc.date.accessioned2016-03-28T00:04:08Z-
dc.date.available2016-03-28T00:04:08Z-
dc.date.issued2015-12-01en_US
dc.identifier.issn0018-9456en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TIM.2015.2459531en_US
dc.identifier.urihttp://hdl.handle.net/11536/129356-
dc.description.abstractElectroencephalography (EEG) can provide important and useful information in clinical diagnosis. The conventional EEG electrode with conductive gel (wet electrode) is most frequently used for measuring EEG. However, the wet electrode encounters the issue of dehydration for long-term measurement. Recently, different types of dry electrodes were proposed to overcome the above issue, but measuring EEG in a hairy site is still a challenge for these electrodes. In this paper, a novel noncontact dry electrode with adaptive mechanical design is proposed to measure EEG in a hairy site without conductive gel. The proposed noncontact dry electrode can measure EEG across the hair layer to reduce the influence of hair. By the adaptive mechanical design, the influence of motion artifact can also be effectively improved. From the experimental results, the proposed noncontact dry electrode can provide a good performance of measuring EEG in a hairy site and a good ability to avoid the influence of motion artifact.en_US
dc.language.isoen_USen_US
dc.subjectConductive gelen_US
dc.subjectdry electrodeen_US
dc.subjectelectroencephalography (EEG)en_US
dc.subjectmotion artifacten_US
dc.titleNovel Noncontact Dry Electrode With Adaptive Mechanical Design for Measuring EEG in a Hairy Siteen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TIM.2015.2459531en_US
dc.identifier.journalIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENTen_US
dc.citation.volume64en_US
dc.citation.issue12en_US
dc.citation.spage3361en_US
dc.citation.epage3368en_US
dc.contributor.department影像與生醫光電研究所zh_TW
dc.contributor.departmentInstitute of Imaging and Biomedical Photonicsen_US
dc.identifier.wosnumberWOS:000364870100020en_US
dc.citation.woscount0en_US
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