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dc.contributor.authorWang, Nanen_US
dc.contributor.authorKobayashi, Takayoshien_US
dc.date.accessioned2016-03-28T00:04:20Z-
dc.date.available2016-03-28T00:04:20Z-
dc.date.issued2015-12-01en_US
dc.identifier.issn2040-8978en_US
dc.identifier.urihttp://dx.doi.org/10.1088/2040-8978/17/12/125302en_US
dc.identifier.urihttp://hdl.handle.net/11536/129567-
dc.description.abstractIsotropic fluorescence emission difference microscopy proposed recently provides a simple method to enhance the spatial resolution in three-dimensions (3D) for fluorescence imaging. However, the subtraction threshold to achieve the condition for appropriately resolving the sample in 3D have not been studied. Then the subtraction factors used in this type of microscopes are still experientially chosen. Based on vector diffraction theory and a 3D numerical model developed here, the subtraction threshold is numerically investigated for the isotropic fluorescence subtraction microscopy. The subtraction factors and peak intensities at the threshold are obtained and comparied both in lateral and axial planes for achieving most appropriate subtraction and inspecting the isotropic characteristic. The effects of radius ratios of implemented 0-pi annular phase plate for generating three dimensional donut spot on the subtracted resolution, peak intensity and negative sidebands are also discussed.en_US
dc.language.isoen_USen_US
dc.subjectsubtraction microscopyen_US
dc.subjectimage processingen_US
dc.subject3D imagingen_US
dc.titleSubtraction threshold for an isotropic fluorescence emission difference microscopeen_US
dc.typeArticleen_US
dc.identifier.doi10.1088/2040-8978/17/12/125302en_US
dc.identifier.journalJOURNAL OF OPTICSen_US
dc.citation.volume17en_US
dc.citation.issue12en_US
dc.contributor.department電機學院zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000366375700024en_US
dc.citation.woscount0en_US
Appears in Collections:Articles