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dc.contributor.authorTsai, CCen_US
dc.contributor.authorChou, Cen_US
dc.contributor.authorHan, CYen_US
dc.contributor.authorHsieh, CHen_US
dc.contributor.authorLiao, KYen_US
dc.contributor.authorChao, YFen_US
dc.date.accessioned2014-12-08T15:17:53Z-
dc.date.available2014-12-08T15:17:53Z-
dc.date.issued2005-12-10en_US
dc.identifier.issn0003-6935en_US
dc.identifier.urihttp://dx.doi.org/10.1364/AO.44.007509en_US
dc.identifier.urihttp://hdl.handle.net/11536/12971-
dc.description.abstractWhat is believed to be a novel phase-sensitive optical heterodyne interferometric ellipsometer is set up to characterize a twisted-nematic liquid crystal (TN-LC) by the elliptical parameters of the output polarization state. This ellipsometer presents the advantages of both polarized optical heterodyne interferometry and optical photometry, which introduce a polarization modulation that is capable of performing with high-sensitivity on phase detection in real time. The twist angle Phi and the untwisted phase retardation Gamma of TN-LC are measured precisely. The experimental results verify that a TN-LC can be treated as identical to an elliptical retarder. (c) 2005 Optical Society of America.en_US
dc.language.isoen_USen_US
dc.titleDetermination of optical parameters of a twisted-nematic liquid crystal by phase-sensitive optical heterodyne interferometric ellipsometryen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/AO.44.007509en_US
dc.identifier.journalAPPLIED OPTICSen_US
dc.citation.volume44en_US
dc.citation.issue35en_US
dc.citation.spage7509en_US
dc.citation.epage7514en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000234012400001-
dc.citation.woscount20-
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