完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Tsai, CC | en_US |
dc.contributor.author | Chou, C | en_US |
dc.contributor.author | Han, CY | en_US |
dc.contributor.author | Hsieh, CH | en_US |
dc.contributor.author | Liao, KY | en_US |
dc.contributor.author | Chao, YF | en_US |
dc.date.accessioned | 2014-12-08T15:17:53Z | - |
dc.date.available | 2014-12-08T15:17:53Z | - |
dc.date.issued | 2005-12-10 | en_US |
dc.identifier.issn | 0003-6935 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1364/AO.44.007509 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/12971 | - |
dc.description.abstract | What is believed to be a novel phase-sensitive optical heterodyne interferometric ellipsometer is set up to characterize a twisted-nematic liquid crystal (TN-LC) by the elliptical parameters of the output polarization state. This ellipsometer presents the advantages of both polarized optical heterodyne interferometry and optical photometry, which introduce a polarization modulation that is capable of performing with high-sensitivity on phase detection in real time. The twist angle Phi and the untwisted phase retardation Gamma of TN-LC are measured precisely. The experimental results verify that a TN-LC can be treated as identical to an elliptical retarder. (c) 2005 Optical Society of America. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Determination of optical parameters of a twisted-nematic liquid crystal by phase-sensitive optical heterodyne interferometric ellipsometry | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1364/AO.44.007509 | en_US |
dc.identifier.journal | APPLIED OPTICS | en_US |
dc.citation.volume | 44 | en_US |
dc.citation.issue | 35 | en_US |
dc.citation.spage | 7509 | en_US |
dc.citation.epage | 7514 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:000234012400001 | - |
dc.citation.woscount | 20 | - |
顯示於類別: | 期刊論文 |