標題: | Crossbar array of selector-less TaOx/TiO2 bilayer RRAM |
作者: | Chou, Chun-Tse Hudec, Boris Hsu, Chung-Wei Lai, Wei-Li Chang, Chih-Cheng Hou, Tuo-Hung 電機學院 電子工程學系及電子研究所 College of Electrical and Computer Engineering Department of Electronics Engineering and Institute of Electronics |
關鍵字: | RRAM;Crossbar array;Forming-free;Self-rectifying;Bilayer;TiO2 |
公開日期: | 1-Nov-2015 |
摘要: | In this work, we have implemented self-rectifying TaOx/TiO2 REAM in a selector-less 6 x 6 crossbar array with various desiring features, including: (1) simple fabrication using only three masks, (2) high self-rectifying ratio up to 10(3) for sneak current suppression, (3) stable bipolar resistive-switching characteristics without the need for electro-forming and current compliance, (4) data retention time over 10(4) s, and (5) robust READ and WRITE disturb immunity. Finally, an achievable array size of 1 Mb was simulated using an All-LPU read scheme and a V/3 write scheme. (C) 2015 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.microrel.2015.04.002 http://hdl.handle.net/11536/129776 |
ISSN: | 0026-2714 |
DOI: | 10.1016/j.microrel.2015.04.002 |
期刊: | MICROELECTRONICS RELIABILITY |
Volume: | 55 |
Issue: | 11 |
起始頁: | 2220 |
結束頁: | 2223 |
Appears in Collections: | 會議論文 |