次14奈米晶片之即時可靠度監測及壽命延長技術

Full metadata record

DC Field	Value	Language
dc.contributor.author	吳凱強	zh_TW
dc.contributor.author	Wu Kai-Chiang	en_US
dc.date.accessioned	2016-03-28T08:17:22Z	-
dc.date.available	2016-03-28T08:17:22Z	-
dc.date.issued	2015	en_US
dc.identifier.govdoc	MOST104-2221-E009-169	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/129945	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=11569282&docId=468084	en_US
dc.description.sponsorship	科技部	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	次14奈米晶片之即時可靠度監測及壽命延長技術	zh_TW
dc.title	On-Chip, Real-Time Reliability Monitoring and Lifetime Extension for Sub-14nm ICs	en_US
dc.type	Plan	en_US
dc.contributor.department	國立交通大學資訊工程學系（所）	zh_TW
Appears in Collections:	Research Plans