半導體-絕緣體-半導體(SIS)異質接面結構應用於光檢測器製備之研究

Full metadata record

DC Field	Value	Language
dc.contributor.author	謝宗雍	zh_TW
dc.contributor.author	HSIEH TSUNG-EONG	en_US
dc.date.accessioned	2016-03-28T08:17:25Z	-
dc.date.available	2016-03-28T08:17:25Z	-
dc.date.issued	2015	en_US
dc.identifier.govdoc	MOST104-2221-E009-034-MY3	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/129987	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=11586381&docId=472785	en_US
dc.description.sponsorship	科技部	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	半導體-絕緣體-半導體(SIS)異質接面結構應用於光檢測器製備之研究	zh_TW
dc.title	A Study of Semiconductor-Insulator-Semiconductor (SIS) Heterojunction Structure Applied to the Fabrication of Photodetectors	en_US
dc.type	Plan	en_US
dc.contributor.department	國立交通大學材料科學與工程學系（所）	zh_TW
Appears in Collections:	Research Plans