Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.date.accessioned | 2016-03-29T00:00:56Z | - |
| dc.date.available | 2016-03-29T00:00:56Z | - |
| dc.date.issued | 2016 | en_US |
| dc.identifier.govdoc | MOST104-2221-E009-058-MY3 | zh_TW |
| dc.identifier.uri | http://hdl.handle.net/11536/130564 | - |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=11588143&docId=473262 | en_US |
| dc.description.sponsorship | 科技部 | zh_TW |
| dc.language.iso | zh_TW | en_US |
| dc.title | 平面及鰭狀場效電晶體高階奈米缺陷統計物理模式：隨機電報雜訊和偏壓溫度不穩度 | zh_TW |
| dc.title | Advanced Nanoscale Defect Statistical Model for Random Telegraph Signals and Bias and Temperature Instabilities in Planar Mosfets and FinFETs | en_US |
| dc.type | Plan | en_US |
| dc.contributor.department | 國立交通大學電子工程學系及電子研究所 | zh_TW |
| Appears in Collections: | Research Plans | |
