統計資料
總造訪次數
| 檢視 | |
|---|---|
| Subgap State Engineering Using Nitrogen Incorporation to Improve Reliability of Amorphous InGaZnO Thin-Film Transistors in Various Stressing Conditions | 1 |
本月總瀏覽
檔案下載
| 檢視 |
|---|
國家瀏覽排行
| 檢視 | |
|---|---|
| 德國 | 1 |
縣市瀏覽排行
| 檢視 |
|---|
| 檢視 | |
|---|---|
| Subgap State Engineering Using Nitrogen Incorporation to Improve Reliability of Amorphous InGaZnO Thin-Film Transistors in Various Stressing Conditions | 1 |
| 檢視 |
|---|
| 檢視 | |
|---|---|
| 德國 | 1 |
| 檢視 |
|---|