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dc.contributor.authorChung, VSWen_US
dc.contributor.authorSamuelsson, Pen_US
dc.contributor.authorButtiker, Men_US
dc.date.accessioned2019-04-03T06:42:52Z-
dc.date.available2019-04-03T06:42:52Z-
dc.date.issued2005-09-01en_US
dc.identifier.issn2469-9950en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.72.125320en_US
dc.identifier.urihttp://hdl.handle.net/11536/13286-
dc.description.abstractWe investigate the visibility of the current and shot-noise correlations of electrical analogs of the optical Mach-Zehnder interferometer and the Hanbury Brown Twiss interferometer. The electrical analogs are discussed in conductors subject to high magnetic fields where electron motion is along edge states. The transport quantities are modulated with the help of an Aharonov-Bohm flux. We discuss the conductance (current) visibility and shot noise visibility as a function of temperature and applied voltage. Dephasing is introduced with the help of fictitious voltage probes. Comparison of these two interferometers is of interest since the Mach-Zehnder interferometer is an amplitude (single-particle) interferometer, whereas the Hanbury Brown Twiss interferometer is an intensity (two-particle) interferometer. A direct comparison is only possible for the shot noise of the two interferometers. We find that the visibility of shot noise correlations of the Hanbury Brown Twiss interferometer as a function of temperature, voltage or dephasing, is qualitatively similar to the visibility of the first harmonic of the shot noise correlation of the Mach-Zehnder interferometer. In contrast, the second harmonic of the shot noise visibility of the Mach-Zehnder interferometer decreases much more rapidly with increasing temperature, voltage or dephasing rate.en_US
dc.language.isoen_USen_US
dc.titleVisibility of current and shot noise in electrical Mach-Zehnder and Hanbury Brown Twiss interferometersen_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevB.72.125320en_US
dc.identifier.journalPHYSICAL REVIEW Ben_US
dc.citation.volume72en_US
dc.citation.issue12en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電機學院zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000232229400086en_US
dc.citation.woscount53en_US
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