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dc.contributor.authorChen, Kuan-Chaoen_US
dc.contributor.authorWu, Chong-Rongen_US
dc.contributor.authorChang, Xiang-Ruien_US
dc.contributor.authorChang, Shu-Weien_US
dc.contributor.authorLee, Si-Chenen_US
dc.contributor.authorLin, Shih-Yenen_US
dc.date.accessioned2017-04-21T06:55:36Z-
dc.date.available2017-04-21T06:55:36Z-
dc.date.issued2016-09en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.7567/JJAP.55.090302en_US
dc.identifier.urihttp://hdl.handle.net/11536/132898-
dc.description.abstractWe experimentally demonstrate that the treatment with low-power oxygen plasma can raise the field-effect mobility in molybdenum-sulfide (MoS2) transistors from 0.01 to 9.6 cm(2)V(-1)s(-1), which is an increment of about three orders of magnitude. The decrease in threshold voltage and the increase in the drain current of the devices indicate that the electron density increases significantly after the mild plasma treatment. The emergence of Mo-O characteristics but the suppression of Mo-S features on the X-ray photoelectron spectrum of the plasma-treated sample suggests that a portion of the MoS2 film becomes conductive molybdenum oxide. This transformation may considerably upgrade the performance of MoS2 transistors. (C) 2016 The Japan Society of Applied Physicsen_US
dc.language.isoen_USen_US
dc.titleEnhancement of field-effect mobility in molybdenum-disulfide transistor through the treatment of low-power oxygen plasmaen_US
dc.identifier.doi10.7567/JJAP.55.090302en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume55en_US
dc.citation.issue9en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000389451200002en_US
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