標題: ESD Protection Design for Touch Panel Control IC Against Latchup-Like Failure Induced by System-Level ESD Test
作者: Ker, Ming-Dou
Chiu, Po-Yen
Shieh, Wuu-Trong
Wang, Chun-Chi
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Electrostatic discharge (ESD);latchup;system-level ESD test;transmission line pulsing (TLP)
公開日期: 二月-2017
摘要: Due to the snapback holding voltage of high-voltage (HV) nMOS smaller than the maximum operating voltage, the traditional power-rail electrostatic discharge (ESD) clamp circuit implemented with such HV nMOS suffered latchup-like failure in a touch panel control IC after the system-level ESD test. A modified design on the power-rail ESD clamp circuit is proposed and verified in an HV CMOS process with 12 V double-diffused drain MOS device. With the holding voltage greater than the maximum operating voltage of 12 V, the touch panel equipped with the modified control IC can successfully pass the system-level ESD test of +/- 15 kV in the air-discharge test mode to meet the level 4 of IEC 61000-4-2 industry specification.
URI: http://dx.doi.org/10.1109/TED.2016.2642042
http://hdl.handle.net/11536/133179
ISSN: 0018-9383
DOI: 10.1109/TED.2016.2642042
期刊: IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume: 64
Issue: 2
起始頁: 642
結束頁: 645
顯示於類別:期刊論文