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dc.contributor.authorHsiao, Yu-Chihen_US
dc.contributor.authorMeng, Chinchunen_US
dc.contributor.authorYang, Chunen_US
dc.date.accessioned2017-04-21T06:56:03Z-
dc.date.available2017-04-21T06:56:03Z-
dc.date.issued2016-02en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMTT.2015.2508790en_US
dc.identifier.urihttp://hdl.handle.net/11536/133530-
dc.description.abstractThis paper describes the design optimization of single-and dual-band inductively source degenerated field-effect transistor low-noise amplifiers (LNAs) using an analytical formula of noise parameters derived through a noise transformation matrix. The dual-band LNA design can be directly expanded from the single-band LNA design using a noise transformation matrix. The derived noise formulas of LNAs reveal that a simultaneous noise and input match (SNIM) can be obtained at a single frequency for a single-band LNA. For a concurrent dual-band LNA, the simultaneous noise match cannot be achieved at two different operating frequencies and thus a balanced design in noise performance is developed using a noise transformation matrix. This paper demonstrates a 5-GHz single-band and a 2.4/5-GHz concurrent dual-band two-stage single-voltage-supply LNA using 0.15-m depletion-mode pseudomorphic HEMT technology to verify design methodology. The inductively source-degenerated common-source amplifier is applied at the input stage. The 5-GHz common-source common-drain (CS-CD) LNA shows 1.4-dB noise figure (NF) with an SNIM. Moreover, the 2.4/5-GHz CS-CD concurrent dual-band LNA has a balanced noise performance of 2.2-dB NF at 2.4 GHz and 2.0-dB NF at 5 GHz, respectively.en_US
dc.language.isoen_USen_US
dc.subjectInductively source-degenerated inductoren_US
dc.subjectlow-noise amplifier (LNA)en_US
dc.subjectnoise transformation matrixen_US
dc.titleDesign Optimization of Single-/Dual-Band FET LNAs Using Noise Transformation Matrixen_US
dc.identifier.doi10.1109/TMTT.2015.2508790en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume64en_US
dc.citation.issue2en_US
dc.citation.spage519en_US
dc.citation.epage532en_US
dc.contributor.department電機學院zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000372487600019en_US
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