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dc.contributor.authorHuang, Chun-Jungen_US
dc.contributor.authorChou, Po-Hanen_US
dc.contributor.authorWei, Hao-Linen_US
dc.contributor.authorSun, Chia-Weien_US
dc.date.accessioned2017-04-21T06:55:38Z-
dc.date.available2017-04-21T06:55:38Z-
dc.date.issued2016-05-06en_US
dc.identifier.issn1077-260Xen_US
dc.identifier.urihttp://dx.doi.org/10.1109/JSTQE.2015.2503318en_US
dc.identifier.urihttp://hdl.handle.net/11536/133650-
dc.description.abstractVerbal fluency tests (VFTs) are widely used frontal lobe neuropsychological tests. They have been frequently used in various functional brain mapping studies. There are two versions of VFTs based on the type of cue: the letter fluency task (LFT) and the category fluency task (CFT). However, the fundamental aspects of brain connectivity across the frontotemporal regions during the VFTs have not been elucidated. In this study, we hypothesized that differences in cortical functional connectivity over the left and right frontotemporal regions may be observed by means of multi-channel functional near-infrared spectroscopy (fNIRS) during the performance of LFT and CFT. Our results from fNIRS (ETG-4000) showed different patterns of brain functional connectivity during the two types of VFTs, which was consistent with the different cognitive requirements of each task. We demonstrate increased brain functional connectivity over the frontal and temporal regions during the LFT than during the CFT; these results are in line with previous brain activity studies using fNIRS to demonstrate higher frontal and temporal region activation during LFT and CFT, with more pronounced frontal activation by the LFT.en_US
dc.language.isoen_USen_US
dc.subjectVerbal fluency testsen_US
dc.subjectfunctional connectivity of brainen_US
dc.subjectfNIRSen_US
dc.titleFunctional Connectivity During Phonemic and Semantic Verbal Fluency Test: A Multichannel Near Infrared Spectroscopy Studyen_US
dc.identifier.doi10.1109/JSTQE.2015.2503318en_US
dc.identifier.journalIEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICSen_US
dc.citation.volume22en_US
dc.citation.issue3en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000374165100001en_US
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