Full metadata record
DC FieldValueLanguage
dc.contributor.authorHong, Hao-Chiaoen_US
dc.contributor.authorChen, Yun-Tseen_US
dc.contributor.authorHung, Shao-Fengen_US
dc.contributor.authorWu, Chin-Chengen_US
dc.contributor.authorChiu, Yien_US
dc.date.accessioned2017-04-21T06:55:55Z-
dc.date.available2017-04-21T06:55:55Z-
dc.date.issued2016-06-15en_US
dc.identifier.issn1530-437Xen_US
dc.identifier.urihttp://dx.doi.org/10.1109/JSEN.2016.2545743en_US
dc.identifier.urihttp://hdl.handle.net/11536/133731-
dc.description.abstractThe angle demodulator (ADM) is a key component for sensors based on angle modulation such as in the path matched differential interferometry (PMDI). Conventional ADMs require tens of operational amplifiers (OPAMPs) and bulky capacitors and resistors, making them difficult to be realized as integrated circuits (ICs). Furthermore, the state-of-the-art ADMs demand precisely controlled modulation indices. Thus, the practical optical modulators in the interferometers cannot but need sophisticated and costly calibrations to precisely control the modulation indices. This paper presents the first ADM IC designed for the PMDI-based sensors. It requires only one OPAMP and thus saves significant area and power, making it best suitable for portable applications. In addition, this novel ADM design tolerates a wide range of the modulation depth of the optical interferometer. As a result, the yield of the PMDI sensor significantly increases and no calibration for an accurate modulation index is necessary. A test chip of the proposed ADM has been designed and successfully verified in 0.18-mu m CMOS. The active area of the proposed circuits is only 476 x 368 mu m(2) and it consumes only 6.26 mW.en_US
dc.language.isoen_USen_US
dc.subjectAngle modulationen_US
dc.subjectangle demodulatoren_US
dc.subjectfiber-optic sensorsen_US
dc.subjectpath matched differential interferometryen_US
dc.titleAn Angle Demodulator IC Using Periodically Reset Integration for Path Matched Differential Interferometry-Based Sensorsen_US
dc.identifier.doi10.1109/JSEN.2016.2545743en_US
dc.identifier.journalIEEE SENSORS JOURNALen_US
dc.citation.volume16en_US
dc.citation.issue12en_US
dc.citation.spage4856en_US
dc.citation.epage4865en_US
dc.contributor.department電機學院zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:000377109500030en_US
Appears in Collections:Articles